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Home > News > Structural changes in tungsten wire and their effect on the properties of hydrogenated nanocrystalline cubic silicon carbide thin films
Structural changes in tungsten wire and their effect on the properties of hydrogenated nanocrystalline cubic silicon carbide thin films
We investigated the structural changes in tungsten wire heated to 1800 °C in SiH4/CH4/H2/N2atmosphere and the effect of the aging tungsten wire on the properties of N-doped hydrogenated nanocrystalline cubic silicon carbide (nc-3C-SiC:H) thin films. The aged tungsten wire had two parts: hot parts of the middle of the wire and relatively cold parts connected to clamps. Tungsten carbide (W2C) layer formed in the wire of the hot parts, while crystalline silicon and cubic silicon carbide (c-Si/3C-SiC) layer deposited on the wire of the cold parts. N-doped nc-3C-SiC:H thin films were deposited for 5 min (thickness: ~ 30 nm) after the tungsten wire was heated under the same condition as during the film deposition for given times (exposure time). No changes in the structural, electrical and optical properties of the nc-3C-SiC:H thin films were observed for the exposure time up to 450 min.
 
Fig. 1. Cross-sectional and surface SEM images of the W wire after the exposure to 1800 °C in SiH4/CH4/H2/N2 atmosphere for 450 min.
 
Source: Thin Solid Films
 
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