Barrier height inhomogeneities in a Ni/SiC-6H Schottky n-type diode
Two models have been used in order to explain the anomalies observed in a Ni/SiC-6H Schottky n-type diode I(V) characteristic. Both, parallel conduction and potential fluctuation models showed that the barrier's height is around a mean value of 1.86 V, corresponding to a factor of ideality of n =1. Another conclusion was that 
V.
It has been, also, explained why the Arrhénius or Richardson plot (ln(Is/T2) versus 1/T) is not linear and why the area of the low barrier height Al, representing a defective zone, is approximately about 0.12% of the total area contact.
Keywords
- Schottky diode;
- Barrier height;
- Inhomogeneities;
- Ni/SiC-6H material
Source:Sciencedirect
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