2.Definition of Dimensional Properties,Terminology and Methods of Silicon Carbide Wafer_Knowledge

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Home > Knowledge > 2.Definition of Dimensional Properties,Terminology and Methods of Silicon Carbide Wafer

2-11.Edge Chips
2-12.Edge Exclusion
2-13.Hex Plate
2-14.Masking Defects
2-15.Orange Peel
2-16.Pits
2-17.Polytypes
2-18.Grain boundaries
2-19.Scratches
2-20.Linear Crystallographic Defects